Solid State Physics Group

University of Glasgow

The Solid State Physics Group makes extensive use of electron microscopy and related analytical techniques to study structure-property relations in a range of advanced materials. During 2002, a new state-of-the-art analytical TEM (nTEM) was installed in Glasgow. The instrument allows structural, chemical and electronic nano-characterisation to be made using electron imaging, diffraction, electron energy loss spectroscopy and energy-dispersive x-ray microanalysis. Very recently, October 2004, a further analytical instrument, this one fitted with an imaging filter, was commissioned (see SRIF2 funding below). In addition to the analytical TEMs we have an advanced instrument that has been modified specifically for the study of magnetic materials. Quantitative maps of magnetic induction distribution can be obtained at very high spatial resolution (~10nm) and in-situ experimentation involving field and temperature variation can be undertaken. The Group has access to electron lithography and other patterning techniques (through our collaborators in Electronics and Electrical Engineering) and has possessed a focused ion beam (FIB) machine since 2001. We also make extensive use of MFM and micromagnetic modelling to tackle a wide range of problems associated with the development of advanced magnetic materials.

Role in the project

• Detailed characterisation of the physical and magnetic nanostructures of films using TEM.
• Patterning of films into elements suitable for application in devices.
• In-situ magnetising experiments to study magnetisation reversal mechanisms.
• Property modification using FIB.

Personnel

Professor J N Chapman

Dr S McVitie

Professor C D W Wilkinson (Department of Electronics & Electrical Engineering)

Professor J M R Weaver (Department of Electronics & Electrical Engineering)