ISIS Facility

Rutherford Appleton Laboratory

The RAL group has considerable experience in the structural and magnetic characterisation of magnetic and superconducting thin film systems: primarily through polarised neutron reflectometry and resonant magnetic x-ray scattering. Magnetic structures can be absolutely determined with near Angstrom resolution as well as in-plane ordering: disorder, patterning etc. We also have experience in micromagnetic simulations of multilayer systems (using the OOMMF code).

Role in the network

• Layer dependent characterisation of thin film systems
• Characterising induced magnetism/interfacial dead layers in half metals/non-magnetic systems
• Characterisation of interfacial sources of spin flip scattering in spin injection
• Characterisation of magnetic semiconductors
• Characterisation of in-plane structures i.e. domains and patterning
• Soft polymer lithography
• Micromagnetic simulation

Personnel

Dr. S. Langridge

Dr R.M. Dalgliesh

Collaborations with ISIS Theory division

Collaboration on soft lithography with Georgia Institute of Technology